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LECO's glow discharge-optical emission spectrometers perform bulk and/or depth profile analyses on solid conductive samples. A RF source is available for analysis of non- conductors. GDS puts reliable analyses of bulk material and surface treatments in the hands of production personnel. |
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| GDS500A "NEW" LECO's CCD-based Glow Discharge Optical Emission Spectrometer (GD-OES) offers you state-of-the-art technology designed specifically for routine elemental determination in most ferrous materials. The GDS500A features improved performance, stability, accuracy, and precision and it's rugged construction is designed to handle the rigors of a production environment. |
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| • Linear calibrations with wide dynamic range • Uniform sample excitation offers improved precision • Freedom from metallurgical history • Low Ar gas consumption reduces cost per test • Separation of sample sputtering from excitation • Quick matrix change with minimal memory effects • Auto cleaning between analysis GDS500A Literature "NEW" Presentation Click here to download GD500A Flash Presentation. "NEW" |
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| GDS-850A LECO introduces the latest technology available for highly accurate bulk analysis as well as quantitative depth profiling for coatings analysis and surface treatments. The GDS-850A Glow Discharge Optical Emission Spectrometer (GD-OES) focuses the latest technology in hardware and software design to enhance your performance requirements for both process control and R & D investigations. This instrument offers a spectral range from 120 - 800 nm and may be configured with up to 58 channels. |
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| • Continuous profile of concentration/thickness • Large dynamic range with concentrations from ppm to 100% by weight • Short analysis time (minutes) • True Plasma Power™ for running non-conductive materials GDS850A Literature "NEW" |
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| SA-2000 This SA-2000 surface analyzer brings the advanced capabilities of atomic emission spectroscopy to the production control environment for quantitative depth profiling. The SA-2000 is designed for determining the composition of conductive and non-conductive materials as a function of depth with a measurement range to 500 microns (best at 10 nm to 50 microns). It is an extremely user-friendly system and its software is hosted in a Microsoft® Windows® environment. Ideal for the analysis of surface-treated materials, it will perform bulk (24 elements nominal) as well as quantitative depth profile analysis. |
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| SA-2000 Literature "NEW" |
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Available Models
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| Additional information on glow discharge... Glow Discharge - A Modern Concept for Coatings Analysis "NEW" By Philippe Hunault and Charles Maul The following article first appeared in the 2001 edition of Millennium Steel and has been reprinted with permission. Frequently Asked Questions Utilizing Glow Discharge in Emission Optical Spectroscopy Technical Briefs Quantitative Depth Profile Analysis by Glow Discharge: Beyond Just Thickness and Coating Weight GD-OES: An Alternative Technique for Depth Profiling Applications Library Take a look at applications notes |
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